Magnetic Thin Films and Neutron Scattering
Dr. Frank Klose
Bragg Institute, ANSTO
4-5 p.m., Tuesday, 9 October 2007
School of Physics Common Room
Room 64, Old Main Building
Magnetic thin films are used in a variety of technical devices, most importantly in modern computers as storage material, as data sensing material and in novel memory chips. In this presentation, I will review applications of polarized neutron scattering in regard to magnetic thin film research. Polarized neutron reflectometry (soon available at ANSTO’s new OPAL reactor) is an ideal tool for investigating vector magnetization profiles in thin film systems with a vertical depth-resolution of a few monolayers. The method has been used for many years, for example, to demonstrate oscillatory exchange coupling in magnetic multilayers, the physical basis of giant magneto-resistance sensors used in modern hard disk drives. Recently developed polarized "off-specular / diffuse" scattering methods also allow investigations of lateral (in-plane) magnetic correlations on length-scales between 1 nm and 100 μm. High-angle magnetic neutron diffraction is an extremely powerful technique for investigating atomic-scale antiferromagnetism in thin films. The latter is very important in regard to the exchange bias effect which is used in magnetic storage technology. Recent research results on Fe-Pt based films for magnetic recording applications will be presented.
Dr. Frank Klose is a scientist with the Bragg Institute at ANSTO, Menai. His main science interest is magnetic thin film physics and he primarily uses polarized synchrotron and neutron beams as his research tool. His previous affiliations include the Spallation Neutron Source at Oak Ridge National Laboratory, Argonne National Laboratory and Hahn Meitner Institute Berlin, where he led research groups in the areas thin film magnetism and neutron scattering instrumentation. Dr. Klose has a Diploma and a Ph.D. in physics from University of Goettingen, Germany.